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Search for "optical reflectance" in Full Text gives 7 result(s) in Beilstein Journal of Nanotechnology.

Mapping the local dielectric constant of a biological nanostructured system

  • Wescley Walison Valeriano,
  • Rodrigo Ribeiro Andrade,
  • Juan Pablo Vasco,
  • Angelo Malachias,
  • Bernardo Ruegger Almeida Neves,
  • Paulo Sergio Soares Guimarães and
  • Wagner Nunes Rodrigues

Beilstein J. Nanotechnol. 2021, 12, 139–150, doi:10.3762/bjnano.12.11

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  • optical reflectance measurements and simulation, we were able to describe the origin of the strongly iridescent wing colors of this Amazonian rainforest damselfly. The method we demonstrate here should be useful for the study of other biological nanostructured systems. Keywords: dielectric constant
  • different strategies found in nature, is astonishing [5][6]. Studies of the origin of physical colors in insects are numerous in the literature and the most commonly used tools are non-local optical reflectance, electron microscopy, and scanning probe microscopy techniques, which give support to theoretical
  • [17][18][19]; nanostructures which make it a natural photonic crystal. We obtain quantitative information about the wing structure and its local relative permittivity values. We also simulate the optical reflectance using the extracted spatial profile of the relative permittivity and compare it with
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Published 28 Jan 2021

Role of redox-active axial ligands of metal porphyrins adsorbed at solid–liquid interfaces in a liquid-STM setup

  • Thomas Habets,
  • Sylvia Speller and
  • Johannes A. A. W. Elemans

Beilstein J. Nanotechnol. 2020, 11, 1264–1271, doi:10.3762/bjnano.11.110

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  • ) substrate and an n-tetradecane solution of the compound [7]. From real-time topographic signature changes in the STM images (Figure 1c), combined with optical reflectance spectroscopy, it was concluded that Mn=O complexes were readily formed in the presence of O2 gas. This was a surprising result, since a
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Published 24 Aug 2020

Hexagonal boron nitride: a review of the emerging material platform for single-photon sources and the spin–photon interface

  • Stefania Castelletto,
  • Faraz A. Inam,
  • Shin-ichiro Sato and
  • Alberto Boretti

Beilstein J. Nanotechnol. 2020, 11, 740–769, doi:10.3762/bjnano.11.61

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  • means, such as optical reflectance and absorption, electron energy loss spectroscopy, X-ray absorption, emission, and inelastic scattering. Regarding luminescence studies, PL is the light emission, i.e., the electromagnetic radiation from matter after the absorption of photons. It is originated by
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Published 08 May 2020

Optimization of Mo/Cr bilayer back contacts for thin-film solar cells

  • Nima Khoshsirat,
  • Fawad Ali,
  • Vincent Tiing Tiong,
  • Mojtaba Amjadipour,
  • Hongxia Wang,
  • Mahnaz Shafiei and
  • Nunzio Motta

Beilstein J. Nanotechnol. 2018, 9, 2700–2707, doi:10.3762/bjnano.9.252

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  • different deposition powers and working pressures. Good adhesion to the SLG substrate has been achieved by means of an ultra-thin Cr layer under the Mo layer. By optimizing the deposition conditions we achieved low surface roughness, high optical reflectance and low sheet resistivity while we could decrease
  • ; bilayer; chromium; DC sputtering; molybdenum; optical reflectance; Introduction Molybdenum (Mo) thin films are widely used as a back contact for photovoltaic devices such as Cu(In1−xGax)S2 (CIGS) and Cu2ZnSnS4 (CZTS) thin-film solar cells. The back contact is the first layer to be deposited and its
  • a functions of the sputtering power and pressure [8][9]. The most successful approach suggested so far to improve the adhesion of Mo back contact layer to the glass substrate (while retaining its conductivity and optical reflectance) is through the deposition of a Mo bilayer rather than a single
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Published 18 Oct 2018

A top-down approach for fabricating three-dimensional closed hollow nanostructures with permeable thin metal walls

  • Carlos Angulo Barrios and
  • Víctor Canalejas-Tejero

Beilstein J. Nanotechnol. 2017, 8, 1231–1237, doi:10.3762/bjnano.8.124

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  • nanopillar array (Figure 1b). The measured thickness of the deposited Al film on a flat substrate was 40 nm. Finally, the sample was exposed to an oxygen plasma (RF power = 50 W, flow rate = 15 sccm) for 30 min (Figure 1c). Optical reflectance characterization The optical reflectance of the fabricated hollow
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Published 08 Jun 2017

Dependence of lattice strain relaxation, absorbance, and sheet resistance on thickness in textured ZnO@B transparent conductive oxide for thin-film solar cell applications

  • Kuang-Yang Kou,
  • Yu-En Huang,
  • Chien-Hsun Chen and
  • Shih-Wei Feng

Beilstein J. Nanotechnol. 2016, 7, 75–80, doi:10.3762/bjnano.7.9

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  • expansion coefficient [10]. Because strain can affect the electronic and optical properties of materials, the strain distribution in the films is an important subject to be investigated. The strain in ZnO films is accumulated during film growth and can be monitored by in situ optical reflectance measurement
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Published 20 Jan 2016

Surface passivation and optical characterization of Al2O3/a-SiCx stacks on c-Si substrates

  • Gema López,
  • Pablo R. Ortega,
  • Cristóbal Voz,
  • Isidro Martín,
  • Mónica Colina,
  • Anna B. Morales,
  • Albert Orpella and
  • Ramón Alcubilla

Beilstein J. Nanotechnol. 2013, 4, 726–731, doi:10.3762/bjnano.4.82

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  • lower than that of polished c-Si substrates. For a randomly textured surface, the reduced reflectance is explained by a second reflection of the incident light at the sidewalls of an opposite pyramid [31]. After coating the silicon substrates, the optical reflectance was further reduced. When a 90 nm
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Published 06 Nov 2013
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